Semiconductor

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Products
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Physics Interfaces and Study Types
ExpandElectrostatics with charge conservationYes
ExpandSemiconductorYes
ExpandSemiconductor Optoelectronics, Beam Envelopes*YesYes
ExpandSemiconductor Optoelectronics, Frequency Domain*YesYes
Boundary Conditions
Surface Charge DensityYes
Thin Insulator GateYes
ExpandContinuity/HeterojunctionYes
ExpandElectrostatics Boundary ConditionsYes
ExpandInsulationYes
ExpandInsulator InterfaceYes
ExpandMetal ContactYes
Carrier Statistics
Fermi-DiracYes
Maxwell-BoltzmannYes
Discretization
Finite ElementYes
Finite Element (Log Equation Formulation)Yes
Finite VolumeYes
Volumetric Domain Properties
ExpandElectrostatics Domain PropertiesYes
ExpandSemiconductor Material ModelYes
Doping
ExpandAnalytic Doping ModelYes
ExpandGeometric Doping ModelYes
Generation-Recombination
Auger RecombinationYes
Direct RecombinationYes
Impact Ionization GenerationYes
Shockley-Read-Hall RecombinationYes
User-Defined GenerationYes
User-Defined RecombinationYes
Mobility Models
Arora Mobility ModelYes
Caughey-Thomas Mobility ModelYes
Fletcher Mobility ModelYes
Lombardi Surface Mobility ModelYes
Power Law Mobility ModelYes
User Defined Mobility ModelYes
Optoelectronics
ExpandOptical TransitionsYes
Trap Density
ExpandAnalytic Trap DensityYes
ExpandGeometric Trap DensityYes
* = Requires all indicated products